In this unit we offer imaging, analysis and control of matter at the nanoscale — keys to future research and development — from the use of the Helios Nanolab 650 microscope. This SEM/FIB combines the most advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with innovative gas chemistries, detectors and manipulators. Featuring unsurpassed SEM resolution, image quality and stunning Tomahawk  FIB performance, imaging, milling or preparing samples is fast and easy for semiconductor and data storage labs, research facilities and industrial applications, some of which are described below.

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In-situ electrical measurement
TEM sample prep
Circuit editing
Nanophotonic structure fabrication

Cross-sectional imaging
Compositional analysis/mapping
3D tomography

Nanowire research
Patterning/Device design
Defect analysis




Additional information