MULTILAYER ANALYSIS
The SNMS System INA-X is especially developed for extreme depth resolution and therefore ideally suited for applications in thin films investigations.
Shown are recent data ion GaAS/AlGaAs/GaAs/GaAs/AlGaInAs/AlGaInAs/InGaAs.
The SNMS System INA-X is especially developed for extreme depth resolution and therefore ideally suited for applications in thin films investigations.
Shown are recent data ion GaAS/AlGaAs/GaAs/GaAs/AlGaInAs/AlGaInAs/InGaAs.